TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_19_54
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-003-02 | FUSED_ID : 6359364768411725874
  IC_TEMP :  -58.90 | VDDM : 1128.62 | AUX_INT :   -8.08 | CsaBias :   83.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12214e-03 / 2
  ADC_P0  : -8.08048e-03 ± 2.26565e-02
  ADC_P1  : 8.38873e-03 ± 5.50649e-04
  ADC_P2  : -6.26993e-06 ± 2.64579e-06
  CSA_Chi2/NDF : 1.40157e-04 / 2
  CSA_P0  : 5.85278e-02 ± 7.89640e-03
  CSA_P1  : 9.85863e-03 ± 5.94937e-04
  CSA_P2  : -4.46128e-05 ± 9.06018e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [10, 27]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0789', '1.800', '0.1537', '1.799', '0.0794', '7.000', '0.7083', 1, 1, 1, 1, 1727882393.7385156]
VI_after__Init : ['1.202', '0.0789', '1.800', '0.1536', '1.801', '0.0740', '7.000', '0.7081', 1, 1, 1, 1, 1727882402.4787986]
VI_at__the_End : ['1.201', '0.4961', '1.800', '0.1405', '1.802', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1727882468.850844]