TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_18_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-004-02 | FUSED_ID : 6359364768411725890
  IC_TEMP :  -64.10 | VDDM : 1116.42 | AUX_INT :   -8.97 | CsaBias :   75.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.54688e-03 / 2
  ADC_P0  : -8.97395e-03 ± 2.66617e-02
  ADC_P1  : 8.50639e-03 ± 6.55989e-04
  ADC_P2  : -6.39883e-06 ± 3.19588e-06
  CSA_Chi2/NDF : 1.05931e-04 / 2
  CSA_P0  : 5.87649e-02 ± 6.86489e-03
  CSA_P1  : 9.78046e-03 ± 5.17220e-04
  CSA_P2  : -4.64740e-05 ± 7.87664e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1691', '1.800', '0.1300', '1.800', '0.0845', '7.000', '0.7079', 1, 1, 1, 1, 1727882295.6231356]
VI_after__Init : ['1.202', '0.1691', '1.800', '0.1299', '1.799', '0.0797', '7.000', '0.7079', 1, 1, 1, 1, 1727882303.8255005]
VI_at__the_End : ['1.197', '0.4866', '1.800', '0.1389', '1.800', '0.1160', '7.000', '0.7087', 1, 1, 1, 1, 1727882370.059378]