TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_16_37
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-005-02 | FUSED_ID : 6359364768411725906
  IC_TEMP :  -56.74 | VDDM : 1122.47 | AUX_INT :   -9.96 | CsaBias :   80.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63012e-03 / 2
  ADC_P0  : -9.96279e-03 ± 2.73305e-02
  ADC_P1  : 8.24817e-03 ± 6.42444e-04
  ADC_P2  : -6.33965e-06 ± 2.99484e-06
  CSA_Chi2/NDF : 1.13831e-04 / 2
  CSA_P0  : 5.86943e-02 ± 7.11629e-03
  CSA_P1  : 9.43489e-03 ± 5.36161e-04
  CSA_P2  : -4.03044e-05 ± 8.16509e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [44]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1538', '1.800', '0.2009', '1.799', '0.0885', '7.000', '0.7081', 1, 1, 1, 1, 1727882197.2737582]
VI_after__Init : ['1.202', '0.1538', '1.800', '0.2006', '1.801', '0.0831', '7.000', '0.7080', 1, 1, 1, 1, 1727882205.4290943]
VI_at__the_End : ['1.202', '0.4915', '1.800', '0.1394', '1.803', '0.1107', '7.000', '0.7088', 1, 1, 1, 1, 1727882272.8338985]