TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_14_59
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-006-02 | FUSED_ID : 6359364768411725922
  IC_TEMP :  -70.03 | VDDM : 1112.34 | AUX_INT :   -8.12 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 1.74292e-04 / 2
  CSA_P0  : 5.74770e-02 ± 8.80564e-03
  CSA_P1  : 9.90278e-03 ± 6.63441e-04
  CSA_P2  : -5.22081e-05 ± 1.01034e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1929', '1.800', '0.1460', '1.800', '0.0856', '7.000', '0.7087', 1, 1, 1, 1, 1727882099.0472612]
VI_after__Init : ['1.201', '0.1928', '1.800', '0.1459', '1.799', '0.0782', '7.000', '0.7081', 1, 1, 1, 1, 1727882107.8786333]
VI_at__the_End : ['1.201', '0.4694', '1.800', '0.1373', '1.805', '0.1149', '7.000', '0.7086', 1, 1, 1, 1, 1727882175.5903187]