TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_08_26
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-010-02 | FUSED_ID : 6359364768411725986
  IC_TEMP :  -63.50 | VDDM : 1119.63 | AUX_INT :  -11.08 | CsaBias :   84.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69622e-03 / 2
  ADC_P0  : -1.10828e-02 ± 2.78087e-02
  ADC_P1  : 8.80732e-03 ± 6.79584e-04
  ADC_P2  : -7.88782e-06 ± 3.30243e-06
  CSA_Chi2/NDF : 1.61859e-04 / 2
  CSA_P0  : 5.97086e-02 ± 8.48576e-03
  CSA_P1  : 9.84992e-03 ± 6.39341e-04
  CSA_P2  : -4.80181e-05 ± 9.73640e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2231', '1.800', '0.1518', '1.800', '0.0884', '7.000', '0.7091', 1, 1, 1, 1, 1727881705.88824]
VI_after__Init : ['1.202', '0.2232', '1.800', '0.1519', '1.800', '0.0806', '7.000', '0.7079', 1, 1, 1, 1, 1727881713.9786136]
VI_at__the_End : ['1.202', '0.4876', '1.800', '0.1372', '1.804', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1727881772.4921596]