TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_05_09
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-012-02 | FUSED_ID : 6359364768411726018
  IC_TEMP :  -62.21 | VDDM : 1118.86 | AUX_INT :   -9.07 | CsaBias :   74.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36045e-03 / 2
  ADC_P0  : -9.07194e-03 ± 2.49733e-02
  ADC_P1  : 8.45496e-03 ± 6.10971e-04
  ADC_P2  : -6.23622e-06 ± 2.96550e-06
  CSA_Chi2/NDF : 1.50506e-04 / 2
  CSA_P0  : 5.99551e-02 ± 8.18274e-03
  CSA_P1  : 1.01639e-02 ± 6.16510e-04
  CSA_P2  : -5.21952e-05 ± 9.38872e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [30, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [30]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1956', '1.800', '0.1323', '1.800', '0.0866', '7.000', '0.7080', 1, 1, 1, 1, 1727881509.398129]
VI_after__Init : ['1.201', '0.1956', '1.800', '0.1323', '1.801', '0.0815', '7.000', '0.7082', 1, 1, 1, 1, 1727881517.493591]
VI_at__the_End : ['1.201', '0.4869', '1.800', '0.1382', '1.799', '0.1132', '7.000', '0.7090', 1, 1, 1, 1, 1727881585.3343618]