TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_03_31
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-013-02 | FUSED_ID : 6359364768411726034
  IC_TEMP :  -59.80 | VDDM : 1125.33 | AUX_INT :   -8.09 | CsaBias :   76.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10798e-03 / 2
  ADC_P0  : -8.08669e-03 ± 2.25276e-02
  ADC_P1  : 8.52683e-03 ± 5.60736e-04
  ADC_P2  : -6.17439e-06 ± 2.76456e-06
  CSA_Chi2/NDF : 1.24430e-04 / 2
  CSA_P0  : 6.08128e-02 ± 7.44020e-03
  CSA_P1  : 9.97285e-03 ± 5.60565e-04
  CSA_P2  : -4.80137e-05 ± 8.53675e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1360', '1.800', '0.1313', '1.799', '0.0859', '7.000', '0.7081', 1, 1, 1, 1, 1727881410.975712]
VI_after__Init : ['1.202', '0.1360', '1.800', '0.1313', '1.801', '0.0808', '7.000', '0.7080', 1, 1, 1, 1, 1727881419.0480733]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1412', '1.808', '0.1155', '7.000', '0.7087', 1, 1, 1, 1, 1727881486.466938]