TEST_NAME : Wafer
TEST_DATE : 24_10_02-16_56_57
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-017-05 | FUSED_ID : 6359364768411726101
  IC_TEMP :  -59.66 | VDDM : 1119.79 | AUX_INT :  -25.70 | CsaBias :   61.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14994e-03 / 2
  ADC_P0  : -2.56971e-02 ± 2.37979e-02
  ADC_P1  : 8.78064e-03 ± 5.88964e-04
  ADC_P2  : -7.03268e-06 ± 2.87794e-06
  CSA_Chi2/NDF : 1.28434e-04 / 2
  CSA_P0  : 5.74826e-02 ± 7.55897e-03
  CSA_P1  : 9.85925e-03 ± 5.69514e-04
  CSA_P2  : -4.84090e-05 ± 8.67302e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [9, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2369', '1.800', '0.1344', '1.799', '0.0884', '7.000', '0.7088', 1, 1, 1, 1, 1727881017.4304926]
VI_after__Init : ['1.202', '0.2369', '1.800', '0.1344', '1.800', '0.0815', '7.000', '0.7082', 1, 1, 1, 1, 1727881025.4697745]
VI_at__the_End : ['1.202', '0.4852', '1.800', '0.1372', '1.804', '0.1141', '7.000', '0.7088', 1, 1, 1, 1, 1727881085.3733892]