TEST_NAME : Wafer
TEST_DATE : 24_10_02-16_55_19
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-011-018-05 | FUSED_ID : 6359364768411726117
  IC_TEMP :  -64.09 | VDDM : 1104.97 | AUX_INT :   -7.97 | CsaBias :   78.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01203e-03 / 2
  ADC_P0  : -7.96505e-03 ± 2.14795e-02
  ADC_P1  : 8.70513e-03 ± 5.36368e-04
  ADC_P2  : -7.10145e-06 ± 2.64606e-06
  CSA_Chi2/NDF : 1.39297e-04 / 2
  CSA_P0  : 5.85746e-02 ± 7.87215e-03
  CSA_P1  : 1.00109e-02 ± 5.93110e-04
  CSA_P2  : -5.09480e-05 ± 9.03236e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2799', '1.800', '0.1958', '1.800', '0.0987', '7.000', '0.7090', 1, 1, 1, 1, 1727880918.9189339]
VI_after__Init : ['1.202', '0.2800', '1.800', '0.1958', '1.801', '0.0914', '7.000', '0.7079', 1, 1, 1, 1, 1727880927.0013275]
VI_at__the_End : ['1.197', '0.4837', '1.800', '0.1413', '1.813', '0.1160', '7.000', '0.7089', 1, 1, 1, 1, 1727880993.0401993]