TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_29_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-012-006-10 | FUSED_ID : 6359364768411730026
  IC_TEMP :  -55.82 | VDDM : 1119.49 | AUX_INT :   -8.25 | CsaBias :   89.61
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09524e-03 / 2
  ADC_P0  : -8.25151e-03 ± 2.23831e-02
  ADC_P1  : 8.22551e-03 ± 5.34779e-04
  ADC_P2  : -5.86033e-06 ± 2.53302e-06
  CSA_Chi2/NDF : 1.04402e-04 / 2
  CSA_P0  : 5.92183e-02 ± 6.81516e-03
  CSA_P1  : 9.39397e-03 ± 5.13473e-04
  CSA_P2  : -3.96178e-05 ± 7.81958e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2263', '1.800', '0.1465', '1.800', '0.0831', '7.000', '0.7080', 1, 1, 1, 1, 1727882983.5484254]
VI_after__Init : ['1.202', '0.2264', '1.800', '0.1464', '1.800', '0.0777', '7.000', '0.7080', 1, 1, 1, 1, 1727882992.5475767]
VI_at__the_End : ['1.202', '0.4909', '1.800', '0.1386', '1.800', '0.1110', '7.000', '0.7086', 1, 1, 1, 1, 1727883052.5350373]