TEST_NAME : Wafer
TEST_DATE : 24_10_02-17_54_20
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-012-021-13 | FUSED_ID : 6359364768411730269
  IC_TEMP :  -71.06 | VDDM : 1097.50 | AUX_INT :  -12.47 | CsaBias :   65.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.60130e-03 / 2
  ADC_P0  : -1.24749e-02 ± 3.46580e-02
  ADC_P1  : 8.75965e-03 ± 8.65449e-04
  ADC_P2  : -6.64053e-06 ± 4.32891e-06
  CSA_Chi2/NDF : 2.14021e-04 / 2
  CSA_P0  : 6.03064e-02 ± 9.75777e-03
  CSA_P1  : 1.10101e-02 ± 7.35177e-04
  CSA_P2  : -6.74215e-05 ± 1.11959e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2115', '1.800', '0.1349', '1.800', '0.0884', '7.000', '0.7072', 1, 1, 1, 1, 1727884460.5124426]
VI_after__Init : ['1.202', '0.2115', '1.800', '0.1349', '1.800', '0.0828', '7.000', '0.7073', 1, 1, 1, 1, 1727884468.6398914]
VI_at__the_End : ['1.202', '0.4830', '1.800', '0.1408', '1.800', '0.1181', '7.000', '0.7078', 1, 1, 1, 1, 1727884536.8959684]