TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_43_33
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-013-003-07 | FUSED_ID : 6359364768411734071
  IC_TEMP :  -63.76 | VDDM : 1104.38 | AUX_INT :  -10.61 | CsaBias :   74.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95494e-03 / 2
  ADC_P0  : -1.06126e-02 ± 2.99817e-02
  ADC_P1  : 8.60959e-03 ± 7.38646e-04
  ADC_P2  : -6.66202e-06 ± 3.61863e-06
  CSA_Chi2/NDF : 1.48765e-04 / 2
  CSA_P0  : 5.86098e-02 ± 8.13528e-03
  CSA_P1  : 9.83853e-03 ± 6.12935e-04
  CSA_P2  : -4.81896e-05 ± 9.33427e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [20, 55, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [2, 34, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2712', '1.800', '0.1515', '1.800', '0.0873', '7.000', '0.7078', 1, 1, 1, 1, 1727887413.134093]
VI_after__Init : ['1.201', '0.2712', '1.800', '0.1514', '1.799', '0.0818', '7.000', '0.7078', 1, 1, 1, 1, 1727887421.3393917]
VI_at__the_End : ['1.201', '0.4817', '1.800', '0.1368', '1.804', '0.1139', '7.000', '0.7086', 1, 1, 1, 1, 1727887488.5191388]