TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_23_52
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-013-015-07 | FUSED_ID : 6359364768411734263
  IC_TEMP :  -60.45 | VDDM : 1129.78 | AUX_INT :   -7.24 | CsaBias :   65.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.81102e-04 / 2
  ADC_P0  : -7.24147e-03 ± 1.88344e-02
  ADC_P1  : 8.19302e-03 ± 4.39681e-04
  ADC_P2  : -6.55316e-06 ± 2.02396e-06
  CSA_Chi2/NDF : 7.29095e-05 / 2
  CSA_P0  : 5.83978e-02 ± 5.69527e-03
  CSA_P1  : 9.36236e-03 ± 4.29098e-04
  CSA_P2  : -3.94419e-05 ± 6.53465e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [54, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4127', '1.800', '0.1608', '1.799', '0.1023', '7.000', '0.7079', 1, 1, 1, 1, 1727886231.9310892]
VI_after__Init : ['1.202', '0.4133', '1.800', '0.1610', '1.800', '0.0968', '7.000', '0.7075', 1, 1, 1, 1, 1727886239.9232447]
VI_at__the_End : ['1.202', '0.4887', '1.800', '0.1372', '1.804', '0.1120', '7.000', '0.7083', 1, 1, 1, 1, 1727886301.5658484]