TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_10_45
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-013-023-00 | FUSED_ID : 6359364768411734384
  IC_TEMP :  -56.44 | VDDM : 1124.93 | AUX_INT :   -7.93 | CsaBias :   81.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02297e-03 / 2
  ADC_P0  : -7.92540e-03 ± 2.16549e-02
  ADC_P1  : 8.17132e-03 ± 5.21794e-04
  ADC_P2  : -5.29306e-06 ± 2.49648e-06
  CSA_Chi2/NDF : 1.47621e-04 / 2
  CSA_P0  : 5.81144e-02 ± 8.10393e-03
  CSA_P1  : 1.01531e-02 ± 6.10573e-04
  CSA_P2  : -4.84205e-05 ± 9.29830e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 17, 40, 48, 57, 107, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [74, 96, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2487', '1.800', '0.1315', '1.800', '0.0828', '7.000', '0.7079', 1, 1, 1, 1, 1727885445.1337392]
VI_after__Init : ['1.201', '0.2488', '1.800', '0.1314', '1.801', '0.0779', '7.000', '0.7075', 1, 1, 1, 1, 1727885453.9201157]
VI_at__the_End : ['1.201', '0.5048', '1.800', '0.1381', '1.804', '0.1101', '7.000', '0.7086', 1, 1, 1, 1, 1727885520.9309862]