TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_09_06
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-013-024-00 | FUSED_ID : 6359364768411734400
  IC_TEMP :  -58.37 | VDDM : 1118.27 | AUX_INT :   -7.80 | CsaBias :   80.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04969e-03 / 2
  ADC_P0  : -7.79942e-03 ± 2.19154e-02
  ADC_P1  : 8.05843e-03 ± 5.14391e-04
  ADC_P2  : -5.64355e-06 ± 2.38748e-06
  CSA_Chi2/NDF : 1.08394e-04 / 2
  CSA_P0  : 5.86114e-02 ± 6.94424e-03
  CSA_P1  : 9.77783e-03 ± 5.23198e-04
  CSA_P2  : -4.25965e-05 ± 7.96769e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3592', '1.800', '0.1547', '1.800', '0.0896', '7.000', '0.7084', 1, 1, 1, 1, 1727885346.1321213]
VI_after__Init : ['1.201', '0.3592', '1.800', '0.1547', '1.800', '0.0824', '7.000', '0.7075', 1, 1, 1, 1, 1727885354.8864896]
VI_at__the_End : ['1.202', '0.5017', '1.800', '0.1385', '1.810', '0.1110', '7.000', '0.7083', 1, 1, 1, 1, 1727885422.0734007]