TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_53_22
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-014-008-09 | FUSED_ID : 6359364768411738249
  IC_TEMP :  -64.29 | VDDM : 1106.71 | AUX_INT :   -7.86 | CsaBias :   72.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18187e-03 / 2
  ADC_P0  : -7.85745e-03 ± 2.32885e-02
  ADC_P1  : 8.09393e-03 ± 5.51267e-04
  ADC_P2  : -5.56145e-06 ± 2.58149e-06
  CSA_Chi2/NDF : 1.58224e-04 / 2
  CSA_P0  : 5.64026e-02 ± 8.38993e-03
  CSA_P1  : 9.76599e-03 ± 6.32121e-04
  CSA_P2  : -4.98750e-05 ± 9.62645e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4069', '1.800', '0.1216', '1.799', '0.0954', '7.000', '0.7079', 1, 1, 1, 1, 1727888002.3238685]
VI_after__Init : ['1.201', '0.4064', '1.800', '0.1220', '1.800', '0.0913', '7.000', '0.7078', 1, 1, 1, 1, 1727888010.4571812]
VI_at__the_End : ['1.202', '0.4666', '1.800', '0.1326', '1.799', '0.1146', '7.000', '0.7088', 1, 1, 1, 1, 1727888078.8159275]