TEST_NAME : Wafer
TEST_DATE : 24_10_02-18_55_01
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-014-009-09 | FUSED_ID : 6359364768411738265
  IC_TEMP :  -86.41 | VDDM : 1110.13 | AUX_INT :  -12.49 | CsaBias :   56.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.42731e-03 / 2
  ADC_P0  : -1.24888e-02 ± 3.34287e-02
  ADC_P1  : 8.72269e-03 ± 8.27208e-04
  ADC_P2  : -6.76214e-06 ± 4.09800e-06
  CSA_Chi2/NDF : 1.76086e-04 / 2
  CSA_P0  : 5.68263e-02 ± 8.85084e-03
  CSA_P1  : 1.04883e-02 ± 6.66847e-04
  CSA_P2  : -6.72413e-05 ± 1.01553e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [50]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [59]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2332', '1.800', '0.1288', '1.800', '0.0881', '7.000', '0.7078', 1, 1, 1, 1, 1727888101.0632098]
VI_after__Init : ['1.202', '0.2331', '1.800', '0.1287', '1.800', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1727888109.1225314]
VI_at__the_End : ['1.202', '0.4443', '1.800', '0.1366', '1.800', '0.1194', '7.000', '0.7086', 1, 1, 1, 1, 1727888170.685771]