TEST_NAME : Wafer
TEST_DATE : 24_10_08-14_10_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-014-023-14 | FUSED_ID : 6359364768411738494
  IC_TEMP :  -59.10 | VDDM : 1108.13 | AUX_INT :   -9.10 | CsaBias :   75.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43674e-03 / 2
  ADC_P0  : -9.10370e-03 ± 2.56702e-02
  ADC_P1  : 7.75495e-03 ± 5.75273e-04
  ADC_P2  : -5.29907e-06 ± 2.55644e-06
  CSA_Chi2/NDF : 1.07261e-04 / 2
  CSA_P0  : 5.78668e-02 ± 6.90785e-03
  CSA_P1  : 9.43885e-03 ± 5.20457e-04
  CSA_P2  : -4.21700e-05 ± 7.92594e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [2, 41, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0850', '1.800', '0.1741', '1.800', '0.0872', '7.000', '0.7075', 1, 1, 1, 1, 1728389445.046706]
VI_after__Init : ['1.202', '0.0850', '1.800', '0.1739', '1.800', '0.0820', '7.000', '0.7072', 1, 1, 1, 1, 1728389453.0980217]
VI_at__the_End : ['1.201', '0.4836', '1.800', '0.1337', '1.800', '0.1107', '7.000', '0.7082', 1, 1, 1, 1, 1728389507.869814]