TEST_NAME : Wafer
TEST_DATE : 24_10_02-19_55_20
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-015-006-04 | FUSED_ID : 6359364768411742308
  IC_TEMP :  -67.93 | VDDM : 1102.55 | AUX_INT :  -10.99 | CsaBias :   64.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93559e-03 / 2
  ADC_P0  : -1.09910e-02 ± 2.98313e-02
  ADC_P1  : 8.44951e-03 ± 7.22266e-04
  ADC_P2  : -6.25380e-06 ± 3.48707e-06
  CSA_Chi2/NDF : 2.06880e-04 / 2
  CSA_P0  : 5.67922e-02 ± 9.59359e-03
  CSA_P1  : 1.02462e-02 ± 7.22808e-04
  CSA_P2  : -5.61767e-05 ± 1.10075e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3746', '1.800', '0.1662', '1.800', '0.1005', '7.000', '0.7080', 1, 1, 1, 1, 1727891720.104674]
VI_after__Init : ['1.201', '0.3747', '1.800', '0.1669', '1.799', '0.0940', '7.000', '0.7079', 1, 1, 1, 1, 1727891728.901024]
VI_at__the_End : ['1.202', '0.4716', '1.800', '0.1367', '1.800', '0.1142', '7.000', '0.7088', 1, 1, 1, 1, 1727891789.2946045]