TEST_NAME : Wafer
TEST_DATE : 24_10_02-19_37_20
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-015-017-03 | FUSED_ID : 6359364768411742483
  IC_TEMP :  -53.55 | VDDM : 1127.48 | AUX_INT :   -7.66 | CsaBias :   86.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17143e-03 / 2
  ADC_P0  : -7.66311e-03 ± 2.31943e-02
  ADC_P1  : 7.91026e-03 ± 5.41089e-04
  ADC_P2  : -5.09751e-06 ± 2.49653e-06
  CSA_Chi2/NDF : 8.02017e-05 / 2
  CSA_P0  : 5.82103e-02 ± 5.97330e-03
  CSA_P1  : 9.33370e-03 ± 4.50045e-04
  CSA_P2  : -3.83966e-05 ± 6.85365e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [12]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1579', '1.800', '0.1144', '1.800', '0.0848', '7.000', '0.7078', 1, 1, 1, 1, 1727890640.1290686]
VI_after__Init : ['1.202', '0.1579', '1.800', '0.1144', '1.801', '0.0793', '7.000', '0.7077', 1, 1, 1, 1, 1727890648.2435548]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1373', '1.800', '0.1115', '7.000', '0.7087', 1, 1, 1, 1, 1727890708.1804533]