TEST_NAME : Wafer
TEST_DATE : 24_10_02-19_29_09
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-015-022-03 | FUSED_ID : 6359364768411742563
  IC_TEMP :  -60.82 | VDDM : 1124.50 | AUX_INT :  -33.94 | CsaBias :   50.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35359e-03 / 2
  ADC_P0  : -3.39406e-02 ± 2.62698e-02
  ADC_P1  : 8.52038e-03 ± 6.22062e-04
  ADC_P2  : -6.75223e-06 ± 2.90542e-06
  CSA_Chi2/NDF : 1.06118e-04 / 2
  CSA_P0  : 5.94975e-02 ± 6.87095e-03
  CSA_P1  : 9.53402e-03 ± 5.17677e-04
  CSA_P2  : -4.26846e-05 ± 7.88360e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [45, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1774', '1.800', '0.1361', '1.800', '0.0825', '7.000', '0.7080', 1, 1, 1, 1, 1727890149.027767]
VI_after__Init : ['1.202', '0.1775', '1.800', '0.1361', '1.799', '0.0769', '7.000', '0.7079', 1, 1, 1, 1, 1727890157.032036]
VI_at__the_End : ['1.202', '0.4872', '1.800', '0.1364', '1.799', '0.1159', '7.000', '0.7087', 1, 1, 1, 1, 1727890218.0943964]