TEST_NAME : Wafer
TEST_DATE : 24_10_02-20_10_06
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-016-012-12 | FUSED_ID : 6359364768411746508
  IC_TEMP :  -54.02 | VDDM : 1126.60 | AUX_INT :  -16.68 | CsaBias :   67.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53045e-03 / 2
  ADC_P0  : -1.66806e-02 ± 2.70122e-02
  ADC_P1  : 8.48821e-03 ± 6.60961e-04
  ADC_P2  : -6.07175e-06 ± 3.20794e-06
  CSA_Chi2/NDF : 1.16870e-04 / 2
  CSA_P0  : 5.94065e-02 ± 7.21063e-03
  CSA_P1  : 9.71615e-03 ± 5.43269e-04
  CSA_P2  : -4.31618e-05 ± 8.27334e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [24, 30]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [18, 26]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1711', '1.800', '0.1571', '1.799', '0.0880', '7.000', '0.7088', 1, 1, 1, 1, 1727892605.8336778]
VI_after__Init : ['1.201', '0.1712', '1.800', '0.1571', '1.802', '0.0809', '7.000', '0.7079', 1, 1, 1, 1, 1727892614.063925]
VI_at__the_End : ['1.202', '0.4957', '1.800', '0.1378', '1.800', '0.1112', '7.000', '0.7086', 1, 1, 1, 1, 1727892673.5138352]