TEST_NAME : Wafer
TEST_DATE : 24_10_02-20_28_06
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-016-023-11 | FUSED_ID : 6359364768411746683
  IC_TEMP :  -56.87 | VDDM : 1122.95 | AUX_INT :   -9.12 | CsaBias :   86.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44907e-03 / 2
  ADC_P0  : -9.12115e-03 ± 2.58045e-02
  ADC_P1  : 8.01062e-03 ± 6.02722e-04
  ADC_P2  : -5.35194e-06 ± 2.79571e-06
  CSA_Chi2/NDF : 9.30560e-05 / 2
  CSA_P0  : 5.81617e-02 ± 6.43420e-03
  CSA_P1  : 9.45109e-03 ± 4.84770e-04
  CSA_P2  : -3.79493e-05 ± 7.38248e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [5]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3735', '1.800', '0.1224', '1.800', '0.0940', '7.000', '0.7080', 1, 1, 1, 1, 1727893685.5622272]
VI_after__Init : ['1.201', '0.3735', '1.800', '0.1225', '1.800', '0.0885', '7.000', '0.7078', 1, 1, 1, 1, 1727893694.4484775]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1363', '1.803', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1727893753.0790417]