TEST_NAME : Wafer
TEST_DATE : 24_10_02-20_45_59
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-017-012-01 | FUSED_ID : 6359364768411750593
  IC_TEMP :  -60.99 | VDDM : 1124.25 | AUX_INT :   -7.48 | CsaBias :   73.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25434e-03 / 2
  ADC_P0  : -7.48325e-03 ± 2.39743e-02
  ADC_P1  : 8.12116e-03 ± 5.64576e-04
  ADC_P2  : -5.81329e-06 ± 2.63202e-06
  CSA_Chi2/NDF : 9.88930e-05 / 2
  CSA_P0  : 5.54152e-02 ± 6.63293e-03
  CSA_P1  : 9.52246e-03 ± 4.99743e-04
  CSA_P2  : -4.17115e-05 ± 7.61050e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [2, 93, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1676', '1.800', '0.1584', '1.800', '0.0915', '7.000', '0.7087', 1, 1, 1, 1, 1727894759.505931]
VI_after__Init : ['1.202', '0.1676', '1.800', '0.1580', '1.801', '0.0839', '7.000', '0.7080', 1, 1, 1, 1, 1727894767.548415]
VI_at__the_End : ['1.202', '0.4863', '1.800', '0.1353', '1.800', '0.1126', '7.000', '0.7086', 1, 1, 1, 1, 1727894834.3244798]