TEST_NAME : Wafer
TEST_DATE : 24_10_08-14_15_32
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-017-018-06 | FUSED_ID : 6359364768411750694
  IC_TEMP :  -77.59 | VDDM : 1098.29 | AUX_INT :  -13.19 | CsaBias :   52.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.49581e-03 / 2
  ADC_P0  : -1.31925e-02 ± 3.38370e-02
  ADC_P1  : 8.30822e-03 ± 7.84005e-04
  ADC_P2  : -6.55152e-06 ± 3.64120e-06
  CSA_Chi2/NDF : 2.17935e-04 / 2
  CSA_P0  : 5.77653e-02 ± 9.84658e-03
  CSA_P1  : 1.04675e-02 ± 7.41869e-04
  CSA_P2  : -6.06591e-05 ± 1.12978e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2161', '1.800', '0.1721', '1.800', '0.0884', '7.000', '0.7076', 1, 1, 1, 1, 1728389731.8826654]
VI_after__Init : ['1.201', '0.2163', '1.800', '0.1718', '1.800', '0.0828', '7.000', '0.7075', 1, 1, 1, 1, 1728389740.0150743]
VI_at__the_End : ['1.201', '0.4713', '1.800', '0.1377', '1.800', '0.1116', '7.000', '0.7081', 1, 1, 1, 1, 1728389802.272278]