TEST_NAME : Wafer
TEST_DATE : 24_10_08-15_13_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-017-020-06 | FUSED_ID : 6359364768411750726
  IC_TEMP :  -53.34 | VDDM : 1115.68 | AUX_INT :   -8.00 | CsaBias :   78.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25348e-03 / 2
  ADC_P0  : -8.00076e-03 ± 2.40411e-02
  ADC_P1  : 7.89758e-03 ± 5.69136e-04
  ADC_P2  : -4.45204e-06 ± 2.67796e-06
  CSA_Chi2/NDF : 1.47138e-04 / 2
  CSA_P0  : 5.68388e-02 ± 8.09066e-03
  CSA_P1  : 9.63876e-03 ± 6.09573e-04
  CSA_P2  : -4.23351e-05 ± 9.28308e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  
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VI_before_Init : ['1.201', '0.1388', '1.800', '0.1673', '1.800', '0.0823', '7.000', '0.7070', 1, 1, 1, 1, 1728393234.965029]
VI_after__Init : ['1.201', '0.1390', '1.799', '0.1669', '1.800', '0.0767', '7.000', '0.7069', 1, 1, 1, 1, 1728393242.7424972]
VI_at__the_End : ['1.201', '0.4959', '1.801', '0.1362', '1.800', '0.1084', '7.000', '0.7080', 1, 1, 1, 1, 1728393299.6780546]