TEST_NAME : Wafer
TEST_DATE : 24_10_02-20_57_28
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-018-010-15 | FUSED_ID : 6359364768411754671
  IC_TEMP :  -55.97 | VDDM : 1120.11 | AUX_INT :   -7.50 | CsaBias :   85.05
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04639e-03 / 2
  ADC_P0  : -7.50407e-03 ± 2.19094e-02
  ADC_P1  : 8.47787e-03 ± 5.48353e-04
  ADC_P2  : -5.80293e-06 ± 2.71631e-06
  CSA_Chi2/NDF : 1.43948e-04 / 2
  CSA_P0  : 5.83991e-02 ± 8.00248e-03
  CSA_P1  : 1.00975e-02 ± 6.02929e-04
  CSA_P2  : -4.62992e-05 ± 9.18190e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 46, 56]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [9, 21, 24, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2579', '1.800', '0.1296', '1.799', '0.0827', '7.000', '0.7079', 1, 1, 1, 1, 1727895448.029779]
VI_after__Init : ['1.202', '0.2579', '1.800', '0.1297', '1.800', '0.0775', '7.000', '0.7079', 1, 1, 1, 1, 1727895456.0331316]
VI_at__the_End : ['1.200', '0.5078', '1.800', '0.1384', '1.799', '0.1121', '7.000', '0.7086', 1, 1, 1, 1, 1727895524.0250368]