TEST_NAME : Wafer
TEST_DATE : 24_10_02-21_08_58
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-037-018-017-08 | FUSED_ID : 6359364768411754776
  IC_TEMP :  -58.98 | VDDM : 1119.03 | AUX_INT :   -8.80 | CsaBias :   70.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60669e-03 / 2
  ADC_P0  : -8.80337e-03 ± 2.72300e-02
  ADC_P1  : 7.99436e-03 ± 6.44710e-04
  ADC_P2  : -4.90172e-06 ± 3.03072e-06
  CSA_Chi2/NDF : 1.20736e-04 / 2
  CSA_P0  : 5.76674e-02 ± 7.32894e-03
  CSA_P1  : 9.45886e-03 ± 5.52182e-04
  CSA_P2  : -4.13339e-05 ± 8.40908e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [14, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1110', '1.800', '0.1706', '1.800', '0.0851', '7.000', '0.7080', 1, 1, 1, 1, 1727896138.0804973]
VI_after__Init : ['1.202', '0.1109', '1.800', '0.1705', '1.800', '0.0795', '7.000', '0.7078', 1, 1, 1, 1, 1727896146.308882]
VI_at__the_End : ['1.202', '0.4847', '1.800', '0.1357', '1.800', '0.1128', '7.000', '0.7087', 1, 1, 1, 1, 1727896212.507816]