TEST_NAME : Wafer
TEST_DATE : 24_10_10-13_24_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-002-010-06 | FUSED_ID : 6359364768416932006
  IC_TEMP :  -76.86 | VDDM : 1095.63 | AUX_INT :  -11.46 | CsaBias :   67.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06467e-03 / 2
  ADC_P0  : -1.14570e-02 ± 3.08188e-02
  ADC_P1  : 8.79489e-03 ± 7.76028e-04
  ADC_P2  : -6.68933e-06 ± 3.90643e-06
  CSA_Chi2/NDF : 2.46152e-04 / 2
  CSA_P0  : 5.66224e-02 ± 1.04646e-02
  CSA_P1  : 1.04259e-02 ± 7.88435e-04
  CSA_P2  : -6.20712e-05 ± 1.20069e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [55]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3348', '1.800', '0.1207', '1.800', '0.0967', '7.000', '0.7082', 1, 1, 1, 1, 1728559442.8581693]
VI_after__Init : ['1.201', '0.3354', '1.800', '0.1208', '1.800', '0.0914', '7.000', '0.7082', 1, 1, 1, 1, 1728559450.6815617]
VI_at__the_End : ['1.201', '0.4625', '1.800', '0.1352', '1.800', '0.1205', '7.000', '0.7088', 1, 1, 1, 1, 1728559509.602996]