TEST_NAME : Wafer
TEST_DATE : 24_10_10-13_35_33
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-002-017-01 | FUSED_ID : 6359364768416932113
  IC_TEMP :  -67.06 | VDDM : 1121.09 | AUX_INT :   -8.85 | CsaBias :   69.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35150e-03 / 2
  ADC_P0  : -8.85280e-03 ± 2.49165e-02
  ADC_P1  : 8.74785e-03 ± 6.37833e-04
  ADC_P2  : -6.25718e-06 ± 3.24457e-06
  CSA_Chi2/NDF : 2.02336e-04 / 2
  CSA_P0  : 5.57982e-02 ± 9.48765e-03
  CSA_P1  : 1.00659e-02 ± 7.14826e-04
  CSA_P2  : -5.22937e-05 ± 1.08860e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [31]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [93]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3786', '1.800', '0.1495', '1.800', '0.0943', '7.000', '0.7074', 1, 1, 1, 1, 1728560132.8239908]
VI_after__Init : ['1.201', '0.3790', '1.800', '0.1494', '1.799', '0.0889', '7.000', '0.7073', 1, 1, 1, 1, 1728560140.9823868]
VI_at__the_End : ['1.201', '0.4780', '1.800', '0.1362', '1.803', '0.1191', '7.000', '0.7081', 1, 1, 1, 1, 1728560204.5466037]