TEST_NAME : Wafer
TEST_DATE : 24_10_10-13_58_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-003-011-11 | FUSED_ID : 6359364768416936123
  IC_TEMP :  -70.54 | VDDM : 1114.81 | AUX_INT :   -8.88 | CsaBias :   61.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50990e-03 / 2
  ADC_P0  : -8.87947e-03 ± 2.62863e-02
  ADC_P1  : 8.85828e-03 ± 6.63204e-04
  ADC_P2  : -7.32541e-06 ± 3.32156e-06
  CSA_Chi2/NDF : 1.69307e-04 / 2
  CSA_P0  : 5.78581e-02 ± 8.67881e-03
  CSA_P1  : 9.79089e-03 ± 6.53885e-04
  CSA_P2  : -4.97872e-05 ± 9.95790e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [17]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3718', '1.800', '0.1394', '1.800', '0.0993', '7.000', '0.7080', 1, 1, 1, 1, 1728561516.2639701]
VI_after__Init : ['1.202', '0.3722', '1.800', '0.1397', '1.801', '0.0924', '7.000', '0.7073', 1, 1, 1, 1, 1728561524.3463905]
VI_at__the_End : ['1.202', '0.4726', '1.800', '0.1342', '1.800', '0.1210', '7.000', '0.7083', 1, 1, 1, 1, 1728561588.5483732]