TEST_NAME : Wafer
TEST_DATE : 24_10_10-13_55_18
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-003-013-11 | FUSED_ID : 6359364768416936155
  IC_TEMP :  -71.70 | VDDM : 1124.14 | AUX_INT :  -10.59 | CsaBias :   73.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72514e-03 / 2
  ADC_P0  : -1.05894e-02 ± 2.81126e-02
  ADC_P1  : 8.42930e-03 ± 6.72647e-04
  ADC_P2  : -6.61961e-06 ± 3.20010e-06
  CSA_Chi2/NDF : 2.11681e-04 / 2
  CSA_P0  : 5.52184e-02 ± 9.70428e-03
  CSA_P1  : 1.00936e-02 ± 7.31147e-04
  CSA_P2  : -5.50335e-05 ± 1.11345e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [76]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3780', '1.800', '0.1435', '1.800', '0.0972', '7.001', '0.7071', 1, 1, 1, 1, 1728561318.3041282]
VI_after__Init : ['1.202', '0.3786', '1.800', '0.1443', '1.800', '0.0917', '7.000', '0.7072', 1, 1, 1, 1, 1728561326.3715558]
VI_at__the_End : ['1.202', '0.4661', '1.800', '0.1314', '1.805', '0.1220', '7.000', '0.7080', 1, 1, 1, 1, 1728561391.9985385]