TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_06_49
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-004-006-03 | FUSED_ID : 6359364768416940131
  IC_TEMP :  -75.85 | VDDM : 1120.18 | AUX_INT :   -7.21 | CsaBias :   45.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.22755e-04 / 2
  ADC_P0  : -7.21280e-03 ± 1.93352e-02
  ADC_P1  : 8.85285e-03 ± 4.87095e-04
  ADC_P2  : -7.74664e-06 ± 2.41602e-06
  CSA_Chi2/NDF : 2.28930e-04 / 2
  CSA_P0  : 5.67273e-02 ± 1.00919e-02
  CSA_P1  : 1.03060e-02 ± 7.60353e-04
  CSA_P2  : -5.63607e-05 ± 1.15793e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [28, 70, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [38, 42, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3113', '1.800', '0.1418', '1.800', '0.0917', '7.000', '0.7077', 1, 1, 1, 1, 1728562009.3231554]
VI_after__Init : ['1.202', '0.3113', '1.800', '0.1419', '1.799', '0.0863', '7.000', '0.7077', 1, 1, 1, 1, 1728562017.441481]
VI_at__the_End : ['1.202', '0.4768', '1.800', '0.1344', '1.802', '0.1221', '7.000', '0.7083', 1, 1, 1, 1, 1728562079.0637994]