TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_18_21
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-004-013-03 | FUSED_ID : 6359364768416940243
  IC_TEMP :  -71.02 | VDDM : 1121.04 | AUX_INT :   -9.63 | CsaBias :   75.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66342e-03 / 2
  ADC_P0  : -9.63399e-03 ± 2.76268e-02
  ADC_P1  : 8.54153e-03 ± 6.76113e-04
  ADC_P2  : -6.69145e-06 ± 3.27859e-06
  CSA_Chi2/NDF : 2.09549e-04 / 2
  CSA_P0  : 5.66611e-02 ± 9.65527e-03
  CSA_P1  : 1.01107e-02 ± 7.27455e-04
  CSA_P2  : -5.43639e-05 ± 1.10783e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [23, 65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [5]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1937', '1.800', '0.1408', '1.799', '0.0887', '7.000', '0.7085', 1, 1, 1, 1, 1728562700.9021893]
VI_after__Init : ['1.202', '0.1937', '1.800', '0.1407', '1.800', '0.0821', '7.000', '0.7079', 1, 1, 1, 1, 1728562709.0136387]
VI_at__the_End : ['1.202', '0.4729', '1.800', '0.1325', '1.800', '0.1202', '7.000', '0.7085', 1, 1, 1, 1, 1728562774.4956486]