TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_24_56
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-004-017-04 | FUSED_ID : 6359364768416940308
  IC_TEMP :  -69.68 | VDDM : 1131.40 | AUX_INT : -135.35 | CsaBias :  -30.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.93458e-03 / 2
  ADC_P0  : -1.35348e-01 ± 3.75956e-02
  ADC_P1  : 1.06429e-02 ± 8.93559e-04
  ADC_P2  : -1.37791e-05 ± 4.18181e-06
  CSA_Chi2/NDF : 1.82271e-04 / 2
  CSA_P0  : 5.74114e-02 ± 9.00494e-03
  CSA_P1  : 1.00804e-02 ± 6.78457e-04
  CSA_P2  : -5.32946e-05 ± 1.03321e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [42, 43, 52, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2119', '1.800', '0.1293', '1.800', '0.0921', '7.003', '0.7079', 1, 1, 1, 1, 1728563096.3759062]
VI_after__Init : ['1.202', '0.2119', '1.800', '0.1293', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1728563104.52931]
VI_at__the_End : ['1.202', '0.4726', '1.800', '0.1365', '1.807', '0.1191', '7.000', '0.7085', 1, 1, 1, 1, 1728563168.5543132]