TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_41_24
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-005-022-09 | FUSED_ID : 6359364768416944489
  IC_TEMP :  -68.99 | VDDM : 1121.78 | AUX_INT :   -7.99 | CsaBias :   78.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37849e-03 / 2
  ADC_P0  : -7.98595e-03 ± 2.51679e-02
  ADC_P1  : 8.72832e-03 ± 6.43549e-04
  ADC_P2  : -6.46075e-06 ± 3.25140e-06
  CSA_Chi2/NDF : 2.15652e-04 / 2
  CSA_P0  : 5.79967e-02 ± 9.79489e-03
  CSA_P1  : 1.03202e-02 ± 7.37974e-04
  CSA_P2  : -5.49836e-05 ± 1.12385e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [22, 30, 64]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4257', '1.800', '0.1620', '1.800', '0.1014', '7.007', '0.7076', 1, 1, 1, 1, 1728564084.492035]
VI_after__Init : ['1.201', '0.4265', '1.800', '0.1623', '1.799', '0.0964', '6.999', '0.7083', 1, 1, 1, 1, 1728564092.5043938]
VI_at__the_End : ['1.201', '0.4858', '1.800', '0.1374', '1.803', '0.1164', '7.000', '0.7088', 1, 1, 1, 1, 1728564157.7513268]