TEST_NAME : Wafer
TEST_DATE : 24_10_10-14_39_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-005-023-09 | FUSED_ID : 6359364768416944505
  IC_TEMP :  -63.17 | VDDM : 1101.29 | AUX_INT :   -9.82 | CsaBias :   74.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45204e-03 / 2
  ADC_P0  : -9.81760e-03 ± 2.57887e-02
  ADC_P1  : 8.49089e-03 ± 6.29506e-04
  ADC_P2  : -6.34243e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 2.28883e-04 / 2
  CSA_P0  : 5.76614e-02 ± 1.00909e-02
  CSA_P1  : 1.03414e-02 ± 7.60274e-04
  CSA_P2  : -5.48373e-05 ± 1.15781e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4761', '1.800', '0.1751', '1.800', '0.0935', '7.000', '0.7079', 1, 1, 1, 1, 1728563986.196475]
VI_after__Init : ['1.202', '0.4771', '1.800', '0.1755', '1.800', '0.0892', '7.000', '0.7080', 1, 1, 1, 1, 1728563994.3069992]
VI_at__the_End : ['1.201', '0.4896', '1.800', '0.1401', '1.801', '0.1163', '7.000', '0.7086', 1, 1, 1, 1, 1728564059.6109087]