TEST_NAME : Wafer
TEST_DATE : 24_10_10-15_24_11
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-006-010-00 | FUSED_ID : 6359364768416948384
  IC_TEMP :  -69.95 | VDDM : 1120.19 | AUX_INT :   -8.51 | CsaBias :   68.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19352e-03 / 2
  ADC_P0  : -8.51273e-03 ± 2.33555e-02
  ADC_P1  : 8.58752e-03 ± 5.76323e-04
  ADC_P2  : -6.79411e-06 ± 2.81218e-06
  CSA_Chi2/NDF : 2.03346e-04 / 2
  CSA_P0  : 5.83435e-02 ± 9.51131e-03
  CSA_P1  : 1.00062e-02 ± 7.16609e-04
  CSA_P2  : -5.23897e-05 ± 1.09131e-05
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [73, 84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [86, 110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4284', '1.800', '0.1544', '1.799', '0.1051', '7.000', '0.7073', 1, 1, 1, 1, 1728566651.0087595]
VI_after__Init : ['1.201', '0.4286', '1.800', '0.1551', '1.800', '0.1002', '7.000', '0.7073', 1, 1, 1, 1, 1728566659.1140764]
VI_at__the_End : ['1.202', '0.4764', '1.799', '0.1370', '1.800', '0.1209', '7.000', '0.7079', 1, 1, 1, 1, 1728566722.2942572]