TEST_NAME : Wafer
TEST_DATE : 24_10_10-15_30_45
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-006-014-00 | FUSED_ID : 6359364768416948448
  IC_TEMP :  -62.70 | VDDM : 1119.84 | AUX_INT :   -8.40 | CsaBias :   76.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18610e-03 / 2
  ADC_P0  : -8.40081e-03 ± 2.32827e-02
  ADC_P1  : 8.58222e-03 ± 5.74528e-04
  ADC_P2  : -6.77930e-06 ± 2.80342e-06
  CSA_Chi2/NDF : 1.38996e-04 / 2
  CSA_P0  : 5.75193e-02 ± 7.86364e-03
  CSA_P1  : 9.63066e-03 ± 5.92468e-04
  CSA_P2  : -4.53821e-05 ± 9.02259e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [2, 64, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 63]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3978', '1.800', '0.1503', '1.800', '0.0949', '7.000', '0.7076', 1, 1, 1, 1, 1728567045.0683444]
VI_after__Init : ['1.201', '0.3978', '1.800', '0.1508', '1.800', '0.0899', '7.000', '0.7074', 1, 1, 1, 1, 1728567053.1777954]
VI_at__the_End : ['1.201', '0.4796', '1.800', '0.1369', '1.806', '0.1170', '7.000', '0.7083', 1, 1, 1, 1, 1728567117.5918276]