TEST_NAME : Wafer
TEST_DATE : 24_10_10-16_25_03
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-007-006-13 | FUSED_ID : 6359364768416952429
  IC_TEMP :  -59.80 | VDDM : 1119.45 | AUX_INT :   -8.01 | CsaBias :   75.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05507e-03 / 2
  ADC_P0  : -8.01186e-03 ± 2.19758e-02
  ADC_P1  : 8.38176e-03 ± 5.35801e-04
  ADC_P2  : -6.06025e-06 ± 2.58871e-06
  CSA_Chi2/NDF : 1.32420e-04 / 2
  CSA_P0  : 5.57572e-02 ± 7.67536e-03
  CSA_P1  : 9.35681e-03 ± 5.78283e-04
  CSA_P2  : -4.21315e-05 ± 8.80656e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [29, 62, 75, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3220', '1.800', '0.1351', '1.800', '0.0909', '7.000', '0.7079', 1, 1, 1, 1, 1728570302.625831]
VI_after__Init : ['1.202', '0.3221', '1.800', '0.1352', '1.800', '0.0856', '7.000', '0.7081', 1, 1, 1, 1, 1728570311.441106]
VI_at__the_End : ['1.202', '0.4740', '1.800', '0.1361', '1.806', '0.1171', '7.000', '0.7087', 1, 1, 1, 1, 1728570375.668388]