TEST_NAME : Wafer
TEST_DATE : 24_10_10-16_21_46
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-007-008-13 | FUSED_ID : 6359364768416952461
  IC_TEMP :  -62.02 | VDDM : 1106.98 | AUX_INT :   -8.50 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.28857e-03 / 2
  ADC_P0  : -8.49501e-03 ± 2.43230e-02
  ADC_P1  : 8.40742e-03 ± 5.98281e-04
  ADC_P2  : -5.88121e-06 ± 2.91751e-06
  CSA_Chi2/NDF : 1.74375e-04 / 2
  CSA_P0  : 5.67469e-02 ± 8.80775e-03
  CSA_P1  : 9.97113e-03 ± 6.63600e-04
  CSA_P2  : -5.12967e-05 ± 1.01058e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [55, 87]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3586', '1.800', '0.1574', '1.800', '0.0966', '7.000', '0.7089', 1, 1, 1, 1, 1728570105.7220147]
VI_after__Init : ['1.202', '0.3590', '1.800', '0.1575', '1.800', '0.0890', '7.000', '0.7080', 1, 1, 1, 1, 1728570114.4762998]
VI_at__the_End : ['1.202', '0.4777', '1.800', '0.1343', '1.807', '0.1170', '7.000', '0.7088', 1, 1, 1, 1, 1728570179.6832294]