TEST_NAME : Wafer
TEST_DATE : 24_10_10-16_10_16
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-007-015-13 | FUSED_ID : 6359364768416952573
  IC_TEMP :  -67.51 | VDDM : 1123.33 | AUX_INT :   -8.54 | CsaBias :   78.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18477e-03 / 2
  ADC_P0  : -8.53725e-03 ± 2.32848e-02
  ADC_P1  : 8.73368e-03 ± 5.88658e-04
  ADC_P2  : -6.72016e-06 ± 2.94850e-06
  CSA_Chi2/NDF : 1.78036e-04 / 2
  CSA_P0  : 5.87594e-02 ± 8.89972e-03
  CSA_P1  : 1.00795e-02 ± 6.70530e-04
  CSA_P2  : -5.29109e-05 ± 1.02114e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3765', '1.800', '0.1950', '1.800', '0.1003', '7.000', '0.7079', 1, 1, 1, 1, 1728569416.1333046]
VI_after__Init : ['1.202', '0.3769', '1.800', '0.1953', '1.799', '0.0949', '7.000', '0.7078', 1, 1, 1, 1, 1728569424.254621]
VI_at__the_End : ['1.202', '0.4793', '1.800', '0.1396', '1.799', '0.1186', '7.000', '0.7086', 1, 1, 1, 1, 1728569490.7213702]