TEST_NAME : Wafer
TEST_DATE : 24_10_10-16_02_02
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-007-020-10 | FUSED_ID : 6359364768416952650
  IC_TEMP :  -54.07 | VDDM : 1127.25 | AUX_INT :   -8.43 | CsaBias :   89.59
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.38309e-03 / 2
  ADC_P0  : -8.42551e-03 ± 2.52541e-02
  ADC_P1  : 8.22775e-03 ± 6.19228e-04
  ADC_P2  : -4.97501e-06 ± 3.01777e-06
  CSA_Chi2/NDF : 8.19212e-05 / 2
  CSA_P0  : 5.79990e-02 ± 6.03699e-03
  CSA_P1  : 9.22622e-03 ± 4.54844e-04
  CSA_P2  : -3.86685e-05 ± 6.92673e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3515', '1.800', '0.1433', '1.800', '0.0961', '7.000', '0.7086', 1, 1, 1, 1, 1728568922.1805966]
VI_after__Init : ['1.202', '0.3515', '1.800', '0.1434', '1.799', '0.0889', '7.000', '0.7079', 1, 1, 1, 1, 1728568931.0449467]
VI_at__the_End : ['1.201', '0.4826', '1.800', '0.1379', '1.802', '0.1142', '7.000', '0.7086', 1, 1, 1, 1, 1728568988.2634776]