TEST_NAME : Wafer
TEST_DATE : 24_10_10-16_49_44
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-008-013-09 | FUSED_ID : 6359364768416956633
  IC_TEMP :  -66.73 | VDDM : 1119.59 | AUX_INT :   -8.38 | CsaBias :   78.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20244e-03 / 2
  ADC_P0  : -8.37941e-03 ± 2.34502e-02
  ADC_P1  : 8.74670e-03 ± 5.90908e-04
  ADC_P2  : -6.99234e-06 ± 2.94289e-06
  CSA_Chi2/NDF : 1.46819e-04 / 2
  CSA_P0  : 5.74421e-02 ± 8.08189e-03
  CSA_P1  : 9.76912e-03 ± 6.08912e-04
  CSA_P2  : -4.85635e-05 ± 9.27302e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3251', '1.800', '0.1361', '1.800', '0.0959', '7.000', '0.7074', 1, 1, 1, 1, 1728571784.731806]
VI_after__Init : ['1.201', '0.3253', '1.800', '0.1362', '1.800', '0.0907', '7.000', '0.7073', 1, 1, 1, 1, 1728571792.808283]
VI_at__the_End : ['1.202', '0.4767', '1.800', '0.1380', '1.800', '0.1171', '7.000', '0.7081', 1, 1, 1, 1, 1728571858.6092887]