TEST_NAME : Wafer
TEST_DATE : 24_10_10-17_50_36
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-009-005-04 | FUSED_ID : 6359364768416960596
  IC_TEMP :  -65.61 | VDDM : 1125.09 | AUX_INT :   -8.96 | CsaBias :   91.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.91359e-04 / 2
  CSA_P0  : 6.07332e-02 ± 9.22670e-03
  CSA_P1  : 1.01874e-02 ± 6.95166e-04
  CSA_P2  : -5.04908e-05 ± 1.05865e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [58, 70, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3003', '1.800', '0.1848', '1.800', '0.0933', '7.000', '0.7086', 1, 1, 1, 1, 1728575436.139299]
VI_after__Init : ['1.202', '0.3002', '1.800', '0.1849', '1.800', '0.0859', '7.000', '0.7080', 1, 1, 1, 1, 1728575444.3686504]
VI_at__the_End : ['1.201', '0.4973', '1.800', '0.1440', '1.800', '0.1163', '7.000', '0.7086', 1, 1, 1, 1, 1728575504.6360693]