TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_00_30
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-004-10 | FUSED_ID : 6359364768416964682
  IC_TEMP :  -65.80 | VDDM : 1115.68 | AUX_INT :   -9.85 | CsaBias :   83.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57450e-03 / 2
  ADC_P0  : -9.85329e-03 ± 2.68948e-02
  ADC_P1  : 8.52782e-03 ± 6.62371e-04
  ADC_P2  : -6.23574e-06 ± 3.24806e-06
  CSA_Chi2/NDF : 1.86326e-04 / 2
  CSA_P0  : 5.68281e-02 ± 9.10455e-03
  CSA_P1  : 1.02753e-02 ± 6.85962e-04
  CSA_P2  : -5.33847e-05 ± 1.04464e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [20, 36, 95, 105, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2434', '1.800', '0.1516', '1.800', '0.0870', '7.000', '0.7078', 1, 1, 1, 1, 1728576030.5022745]
VI_after__Init : ['1.202', '0.2435', '1.800', '0.1517', '1.799', '0.0817', '7.000', '0.7080', 1, 1, 1, 1, 1728576038.8166256]
VI_at__the_End : ['1.202', '0.4854', '1.800', '0.1413', '1.803', '0.1156', '7.000', '0.7086', 1, 1, 1, 1, 1728576097.775173]