TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_15_18
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-013-10 | FUSED_ID : 6359364768416964826
  IC_TEMP :  -59.79 | VDDM : 1120.53 | AUX_INT :   -9.70 | CsaBias :   76.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45031e-03 / 2
  ADC_P0  : -9.69777e-03 ± 2.57820e-02
  ADC_P1  : 8.64543e-03 ± 6.42528e-04
  ADC_P2  : -6.50901e-06 ± 3.18556e-06
  CSA_Chi2/NDF : 9.89595e-05 / 2
  CSA_P0  : 5.98240e-02 ± 6.63516e-03
  CSA_P1  : 9.75516e-03 ± 4.99911e-04
  CSA_P2  : -4.59539e-05 ± 7.61306e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [73]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [24, 45]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2543', '1.800', '0.1756', '1.800', '0.0920', '7.000', '0.7080', 1, 1, 1, 1, 1728576918.4777324]
VI_after__Init : ['1.202', '0.2544', '1.800', '0.1757', '1.800', '0.0866', '7.000', '0.7080', 1, 1, 1, 1, 1728576926.527167]
VI_at__the_End : ['1.201', '0.4876', '1.800', '0.1411', '1.800', '0.1126', '7.000', '0.7087', 1, 1, 1, 1, 1728576991.1099682]