TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_20_13
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-016-13 | FUSED_ID : 6359364768416964877
  IC_TEMP :  -61.18 | VDDM : 1125.59 | AUX_INT :   -8.89 | CsaBias :   74.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59256e-03 / 2
  ADC_P0  : -8.88783e-03 ± 2.70309e-02
  ADC_P1  : 8.37298e-03 ± 6.50197e-04
  ADC_P2  : -6.26219e-06 ± 3.10767e-06
  CSA_Chi2/NDF : 1.21949e-04 / 2
  CSA_P0  : 5.98840e-02 ± 7.36566e-03
  CSA_P1  : 1.00401e-02 ± 5.54949e-04
  CSA_P2  : -4.92384e-05 ± 8.45122e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [25]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3777', '1.800', '0.1384', '1.800', '0.0947', '7.000', '0.7079', 1, 1, 1, 1, 1728577213.3106546]
VI_after__Init : ['1.202', '0.3781', '1.800', '0.1384', '1.800', '0.0894', '7.000', '0.7080', 1, 1, 1, 1, 1728577221.3360367]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1385', '1.800', '0.1142', '7.000', '0.7088', 1, 1, 1, 1, 1728577285.7390013]