TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_23_31
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-018-13 | FUSED_ID : 6359364768416964909
  IC_TEMP :  -57.92 | VDDM : 1130.16 | AUX_INT :  -10.49 | CsaBias :   66.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73562e-03 / 2
  ADC_P0  : -1.04863e-02 ± 2.82072e-02
  ADC_P1  : 8.58208e-03 ± 6.88767e-04
  ADC_P2  : -6.80894e-06 ± 3.34280e-06
  CSA_Chi2/NDF : 9.96430e-05 / 2
  CSA_P0  : 6.03287e-02 ± 6.65803e-03
  CSA_P1  : 9.90266e-03 ± 5.01635e-04
  CSA_P2  : -4.59243e-05 ± 7.63930e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [49, 65]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3477', '1.800', '0.1759', '1.800', '0.0937', '7.000', '0.7080', 1, 1, 1, 1, 1728577411.1101997]
VI_after__Init : ['1.202', '0.3480', '1.800', '0.1760', '1.800', '0.0888', '7.000', '0.7080', 1, 1, 1, 1, 1728577419.9045444]
VI_at__the_End : ['1.202', '0.4976', '1.800', '0.1398', '1.800', '0.1144', '7.000', '0.7089', 1, 1, 1, 1, 1728577483.1756742]