TEST_NAME : Wafer
TEST_DATE : 24_10_10-18_33_23
OPERATOR  : Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-042-010-024-13 | FUSED_ID : 6359364768416965005
  IC_TEMP :  -58.09 | VDDM : 1122.32 | AUX_INT :   -8.06 | CsaBias :   81.65
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.21445e-03 / 2
  ADC_P0  : -8.05985e-03 ± 2.36224e-02
  ADC_P1  : 8.21467e-03 ± 5.72322e-04
  ADC_P2  : -5.40257e-06 ± 2.74820e-06
  CSA_Chi2/NDF : 1.40698e-04 / 2
  CSA_P0  : 5.80643e-02 ± 7.91163e-03
  CSA_P1  : 9.70608e-03 ± 5.96084e-04
  CSA_P2  : -4.58742e-05 ± 9.07765e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [84]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3369', '1.800', '0.1670', '1.800', '0.0953', '7.000', '0.7077', 1, 1, 1, 1, 1728578003.201488]
VI_after__Init : ['1.202', '0.3368', '1.800', '0.1672', '1.800', '0.0913', '7.000', '0.7082', 1, 1, 1, 1, 1728578011.3008776]
VI_at__the_End : ['1.202', '0.4846', '1.800', '0.1332', '1.800', '0.1133', '7.000', '0.7083', 1, 1, 1, 1, 1728578075.8667862]